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硒化物晶体

  • 二硒化钼晶体(99.995%) 2H-MoSe2(Molybdenum Diselenide)-N型
  • 二硒化钼晶体(99.995%) 2H-MoSe2(Molybdenum Diselenide)-N型
  • 二硒化钼晶体(99.995%) 2H-MoSe2(Molybdenum Diselenide)-N型
  • 二硒化钼晶体(99.995%) 2H-MoSe2(Molybdenum Diselenide)-N型
  • 二硒化钼晶体(99.995%) 2H-MoSe2(Molybdenum Diselenide)-N型
二硒化钼晶体(99.995%) 2H-MoSe2(Molybdenum Diselenide)-N型二硒化钼晶体(99.995%) 2H-MoSe2(Molybdenum Diselenide)-N型二硒化钼晶体(99.995%) 2H-MoSe2(Molybdenum Diselenide)-N型二硒化钼晶体(99.995%) 2H-MoSe2(Molybdenum Diselenide)-N型二硒化钼晶体(99.995%) 2H-MoSe2(Molybdenum Diselenide)-N型

二硒化钼晶体(99.995%) 2H-MoSe2(Molybdenum Diselenide)-N型

二硒化钼晶体 2H-MoSe2(Molybdenum Diselenide)-N型
晶体尺寸:~10毫米
电学特性:N型半导体
晶体结构:六边形
晶胞参数:a = b = 0.329 nm, c = 1.289 nm, α = β = 90°, γ = 120°
晶体类型:合成
晶体纯度:99.995%


X-ray diffraction on a MoSe2 single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 4 XRD peaks correspond, from left to right, to (00l) with l = 2, 4, 6, 8


Powder X-ray diffraction (XRD) of a single crystal MoSe2. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.


Stoichiometric analysis of a single crystal MoSe2 by Energy-dispersive X-ray spectroscopy (EDX).


Raman spectrum of a single crystal MoSe2. Measurement was performed with a 785 nm Raman system at room temperature.

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