Technical Specifications
l Measurement precision in Z direction: 0.1nm
l Noise: less than 0.3 nm RMS in X/Y direction, less than 0.2 nm RMS in Z direction
l Scan type: by Sample/Probe/Lateral force
Functions and Characteristics
l Microstructure characterization of graphene surface
l Test of surface charge distribution of samples
l Voltage etching processingContact: David Yan
Phone: 13914543285
Tel: 0523-86190619,86192878
Email: taizhou@sunano.com.cn
Add: No 168,Fenghuang Road,Taizhou,Jiangsu,China