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Testing services

  • Atomic Force Microscopy
Atomic Force Microscopy

Atomic Force Microscopy

Technical Specifications

l   Measurement precision in Z direction: 0.1nm

l   Noise: less than 0.3 nm RMS in X/Y direction, less than 0.2 nm RMS in Z direction

l   Scan type: by Sample/Probe/Lateral force


Functions and Characteristics

l   Microstructure characterization of graphene surface

l   Test of surface charge distribution of samples

l Voltage etching processing
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